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Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity.
Debesh Kumar Das
Tomoo Inoue
Susanta Chakraborty
Hideo Fujiwara
Published in:
Asian Test Symposium (2004)
Keyphrases
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test generation
test cases
symbolic execution
logic circuits
design automation
test sequences
tractable cases
static analysis
circuit design
mutation testing
asynchronous circuits
data sets
data exchange
integrity constraints
design process
computer vision
real world