Optimal Ordering of Analog Integrated Circuit Tests to Minimize Test Time.

Scott D. Huss Ronald S. Gyurcsik

Published in: DAC (1991)

Keyphrases

integrated circuit
test cases
test suite
statistical tests
built in self test
dynamic programming
worst case
optimal solution
diagnostic tests
test data
pattern recognition
test generation
post hoc
real time
partial order
image processing
null hypothesis
test statistic