Test Generation for MOS Circuits.
Harry H. ChenRobert G. MathewsJohn A. NewkirkPublished in: ITC (1984)
Keyphrases
- test generation
- floating gate
- flip flops
- test cases
- symbolic execution
- test sequences
- design automation
- static analysis
- mutation testing
- quality assurance
- software testing
- high speed
- circuit design
- regression testing
- software engineering
- power dissipation
- test data generation
- project management
- data warehouse
- machine learning