All Tests for a Fault Are Not Equally Valuable for Defect Detection.

Rohit Kapur Jaehong Park M. Ray Mercer

Published in: ITC (1992)

Keyphrases

defect detection
fault diagnosis
feature extraction
fault detection
automated visual inspection
textured surfaces
machine learning
real time
neural network
web pages
knowledge base
case study
multiscale
multiresolution
fuzzy logic
fault detection and isolation