Test generation based on synthesizable VHDL descriptions.
Manzer MasudMaddu KarunaratnePublished in: EURO-DAC (1993)
Keyphrases
- test generation
- field programmable gate array
- test cases
- symbolic execution
- hardware description language
- test sequences
- static analysis
- design automation
- quality assurance
- mutation testing
- hardware implementation
- high level
- programmable logic
- test data generation
- software testing
- artificial intelligence
- parallel computing
- databases
- embedded systems
- code coverage
- data sets
- circuit design
- regression testing
- open source
- object oriented
- error rate