On test generation for combinational circuits consisting of AND and EXOR gates.
Shunichi ToidaNageswara S. V. RaoPublished in: VTS (1992)
Keyphrases
- test generation
- logic circuits
- low power
- test cases
- symbolic execution
- test sequences
- design automation
- mutation testing
- static analysis
- software testing
- power dissipation
- asynchronous circuits
- high speed
- quality assurance
- power consumption
- regression testing
- case study
- decision trees
- code coverage
- data sets
- open source
- image data
- high level
- image processing