An Approach for Reducing Leakage Current Variation due to Manufacturing Variability.
Tsuyoshi SakataTakaaki OkumuraAtsushi KurokawaHidenari NakashimaHiroo MasudaTakashi SatoMasanori HashimotoKoutaro HachiyaKatsuhiro FurukawaMasakazu TanakaHiroshi TakafujiToshiki KanamotoPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2009)