Model based generation of high coverage test suites for embedded systems.
Orlando FerranteAlberto FerrariMarco MarazzaPublished in: ETS (2014)
Keyphrases
- embedded systems
- test suite
- test cases
- low cost
- resource limited
- embedded software
- regression testing
- real time systems
- test suite reduction
- embedded devices
- computing power
- processing power
- code coverage
- real time image processing
- software testing
- software systems
- hardware software
- set of test cases
- database
- number of test cases
- mutation testing
- test case generation
- embedded real time systems
- java programs
- hw sw
- testing process
- multi agent
- consumer electronics
- flash memory
- field programmable gate array