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Improving a Test Set to Cover Test Holes by Detecting Gate-Exhaustive Faults.

Irith Pomeranz
Published in: DFT (2020)
Keyphrases
  • test set
  • test cases
  • test data
  • error rate
  • training set
  • evaluation methodology
  • random selection
  • training data
  • class distribution
  • data sets
  • feature extraction
  • fault diagnosis
  • fault detection
  • training and test data