Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI.
Yacoub M. El-ZiqRichard J. CloutierPublished in: ITC (1981)
Keyphrases
- test generation
- test cases
- mutation testing
- high speed
- vlsi circuits
- test sequences
- low power
- symbolic execution
- low cost
- single chip
- computer vision
- quality assurance
- artificial intelligence
- design automation
- object oriented
- circuit design
- test suite
- quality control
- power consumption
- focal plane
- relational databases
- image processing
- database