Redundancy Removal and Test Generation for Circuits with Non-Boolean Primitives.
Srimat T. ChakradharSteven G. RothweilerPublished in: VTS (1995)
Keyphrases
- test generation
- test cases
- test sequences
- design automation
- symbolic execution
- mutation testing
- software testing
- quality assurance
- truth table
- static analysis
- high level
- high speed
- building blocks
- boolean functions
- multi valued
- regression testing
- test data generation
- database
- cooperative
- code coverage
- computer vision
- data sets