An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing.

Yuan-Chieh Hsu Sandeep K. Gupta

Published in: Asian Test Symposium (1998)

Keyphrases

pattern generator
test generation
test cases
software testing
real time
test sequences
multi modal
test data
statistical tests
test suite
high speed
computationally efficient
shortest path
humanoid robot
destination node