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On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST).

Seyed Nima MozaffariBonita BhaskaranShantanu SarangiSuhas M. SatheeshKuo Lin FuNithin ValentineP. ManikandanMahmut Yilmaz
Published in: VTS (2022)
Keyphrases
  • test cases
  • test data
  • regression testing
  • hidden markov models
  • databases
  • machine learning
  • artificial intelligence
  • test generation