Post-silicon diagnosis of segments of failing speedpaths due to manufacturing variations.
Lin XieAzadeh DavoodiKewal K. SalujaPublished in: DAC (2010)
Keyphrases
- medical diagnosis
- model based reasoning
- model based diagnosis
- quality control
- low cost
- manufacturing processes
- fault detection
- fault diagnosis
- production planning
- diagnostic reasoning
- manufacturing industry
- equal length
- manufacturing systems
- real time
- raw material
- semiconductor manufacturing
- diagnostic tests
- space charge
- attention deficit hyperactivity disorder