RAW MATERIAL
Experts
- Hui-Ming Wee
- Biswajit Sarkar
- Jean-Pierre Kenné
- Leopoldo Eduardo Cárdenas-Barrón
- George Q. Huang
- Ata Allah Taleizadeh
- Fei Tao
- Lixin Tang
- Francesco Martinelli
- Ali Gharbi
- Chih-Hsiung Wang
- Bhaba R. Sarker
- Damien Trentesaux
- Jingshan Li
- Paul Valckenaers
- Mohammed Dahane
- Nidhal Rezg
- Tsu-Pang Hsieh
- Alexandre Dolgui
- P. C. Jha
- Tzyh Jong Tarn
- Jinn-Tsair Teng
- Zheng Wang
- Ying Cheng
- Liang-Yuh Ouyang
- Erik Puik
- Hao Zhang
- Daniël Telgen
- Leo van Moergestel
- S. K. Goyal
- Hardik N. Soni
- Cong Zhao
- Konstantina Skouri
- André Thomas
- Ray Y. Zhong
- Jan Holmström
- Gisela Lanza
- Lei Wang
- Paulo Leitão
Venues
- Eur. J. Oper. Res.
- Comput. Ind. Eng.
- CoRR
- Int. J. Prod. Res.
- WSC
- Oper. Res.
- IEEE Access
- Comput. Chem. Eng.
- J. Intell. Manuf.
- IEEM
- IEEE Trans. Autom. Control.
- Comput. Oper. Res.
- CASE
- Int. J. Syst. Sci.
- Int. J. Comput. Integr. Manuf.
- J. Oper. Res. Soc.
- Ann. Oper. Res.
- ETFA
- ACC
- Manuf. Serv. Oper. Manag.
- Int. J. Manuf. Technol. Manag.
- APMS
- Manag. Sci.
- APMS (2)
- CDC
- IECON
- ICRA
- IEEE Trans. Ind. Electron.
- Expert Syst. Appl.
- APMS (1)
- RAIRO Oper. Res.
- IEEE Trans. Engineering Management
- Autom.
- Ind. Manag. Data Syst.
- Entropy
- Appl. Math. Comput.
- IGARSS
- Int. Trans. Oper. Res.
- Sensors
Related Topics
Related Keywords
Popularity