RAW MATERIAL
Experts
- George Q. Huang
- Hui-Ming Wee
- Jean-Pierre Kenné
- Ata Allah Taleizadeh
- Biswajit Sarkar
- Leopoldo Eduardo Cárdenas-Barrón
- Francesco Martinelli
- Fei Tao
- Ali Gharbi
- Lixin Tang
- Damien Trentesaux
- Jingshan Li
- Bhaba R. Sarker
- Chih-Hsiung Wang
- Nidhal Rezg
- Tzyh Jong Tarn
- P. C. Jha
- Jinn-Tsair Teng
- Paul Valckenaers
- Alexandre Dolgui
- Ying Cheng
- Mohammed Dahane
- Zheng Wang
- Tsu-Pang Hsieh
- Liang-Yuh Ouyang
- Hao Zhang
- Erik Puik
- Shey-Huei Sheu
- Jan Holmström
- Nita H. Shah
- Anshu Gupta
- Cong Zhao
- Chung-Yuan Dye
- Adnène Hajji
- Sven Jacobi
- Przemyslaw Ignaciuk
- Suresh P. Sethi
- Daniël Telgen
- André Thomas
Venues
- Eur. J. Oper. Res.
- Comput. Ind. Eng.
- CoRR
- Int. J. Prod. Res.
- WSC
- IEEE Access
- Oper. Res.
- Comput. Chem. Eng.
- J. Intell. Manuf.
- IEEE Trans. Autom. Control.
- IEEM
- Int. J. Comput. Integr. Manuf.
- Int. J. Syst. Sci.
- CASE
- Comput. Oper. Res.
- J. Oper. Res. Soc.
- Ann. Oper. Res.
- Manuf. Serv. Oper. Manag.
- ETFA
- ACC
- Manag. Sci.
- Int. J. Manuf. Technol. Manag.
- CDC
- APMS (2)
- IEEE Trans. Engineering Management
- APMS
- Expert Syst. Appl.
- IEEE Trans. Ind. Electron.
- IECON
- ICRA
- Sensors
- Autom.
- Decis. Sci.
- RAIRO Oper. Res.
- APMS (1)
- Comput. Ind.
- Entropy
- Int. Trans. Oper. Res.
- Appl. Math. Comput.
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