Fault detection for IC board using histogram of thermography.
Satoshi NishinoKenji OhshimaPublished in: Systems and Computers in Japan (2001)
Keyphrases
- fault detection
- industrial processes
- fault diagnosis
- fault identification
- tennessee eastman
- condition monitoring
- rotating machinery
- failure detection
- integrated circuit
- fuel cell
- power plant
- robust fault detection
- fault localization
- gray level
- fault detection and isolation
- fault detection and diagnosis
- case based reasoning
- data mining