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Test generation for sequential circuits.
Hi-Keung Tony Ma
Srinivas Devadas
A. Richard Newton
Alberto L. Sangiovanni-Vincentelli
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1988)
Keyphrases
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test generation
test cases
symbolic execution
test sequences
design automation
software testing
quality assurance
static analysis
high speed
mutation testing
information systems
software systems
regression testing
test data generation