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A Memory Fault Simulator for Radiation-Induced Effects in SRAMs.
Paolo Rech
Alberto Bosio
Patrick Girard
Serge Pravossoudovitch
Arnaud Virazel
Luigi Dilillo
Published in:
Asian Test Symposium (2010)
Keyphrases
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x ray
fault detection
failure modes
fault diagnosis
neural network
infrared
information systems
memory requirements
memory space
case study
main memory
simulation model
fault management