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NAND flash testing: A preliminary study on actual defects.

Pierre-Didier MaurouxArnaud VirazelAlberto BosioLuigi DililloPatrick GirardSerge PravossoudovitchBenoît Godard
Published in: ITC (2009)
Keyphrases
  • real world
  • test cases
  • defect detection
  • defect classification