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Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique.
Hakim Tahi
Boualem Djezzar
Abdelmadjid Benabdelmoumene
Amel Chenouf
Mohamed Goudjil
Published in:
Microelectron. Reliab. (2014)
Keyphrases
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metal oxide
question answering
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user interface
natural language processing
room temperature
deep learning
graphical interface
si sio
belief nets
wall street journal
search engine
computer interface
transmission electron microscopy
fuel cell
novice users
electron microscopy
human computer interface