Mohamed Goudjil

Publication Activity (10 Years)

Years Active: 2014-2018
Publications (10 Years): 1

Top Topics

Active Learning

Reliability Analysis

Room Temperature

Top Venues

Int. J. Autom. Comput.

J. Electron. Test.

Microelectron. Reliab.

Publications

Mohamed Goudjil, Mouloud Koudil, Mouldi Bedda, Noureddine Ghoggali
A Novel Active Learning Method Using SVM for Text Classification. Int. J. Autom. Comput. 15 (3) (2018)
Hakim Tahi, Boualem Djezzar, Karim Benmassai, Mohamed Boubaaya, Abdelmadjid Benabdelmoumene, Amel Chenouf, Mohamed Goudjil
Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction. IDT (2014)
Cherifa Tahanout, Hakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Bécharia Nadji
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction. J. Electron. Test. 30 (4) (2014)
Hakim Tahi, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Amel Chenouf, Mohamed Goudjil
Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique. Microelectron. Reliab. 54 (5) (2014)
Abdelmadjid Benabdelmoumene, Boualem Djezzar, Hakim Tahi, Amel Chenouf, Mohamed Goudjil, Rafik Serhane, Fayçal Hadj Larbi, Mohamed Kechouane
Does NBTI effect in MOS transistors depend on channel length? ICM (2014)
Amel Chenouf, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Hakim Tahi, Mohamed Goudjil
Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses. IDT (2014)
Mohamed Boubaaya, Hakim Tahi, Boualem Djezzar, Karim Benmassai, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Djamila Doumaz, Abdelhak Feraht Hemida
, H and H2 as diffusion species. IDT (2014)