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Hakim Tahi
ORCID
Publication Activity (10 Years)
Years Active: 2013-2015
Publications (10 Years): 1
Top Topics
Charge Coupled Devices
Magnetic Field
Diffusion Processes
Plant Species
Top Venues
Microelectron. Reliab.
IDT
J. Electron. Test.
ICM
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Publications
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S. M. Merah
,
Bécharia Nadji
,
Hakim Tahi
Low magnetic field Impact on NBTI degradation.
Microelectron. Reliab.
55 (9-10) (2015)
Hakim Tahi
,
Boualem Djezzar
,
Karim Benmassai
,
Mohamed Boubaaya
,
Abdelmadjid Benabdelmoumene
,
Amel Chenouf
,
Mohamed Goudjil
Investigation of defect microstructures responsible for NBTI degradation using effective dipole moment extraction.
IDT
(2014)
Cherifa Tahanout
,
Hakim Tahi
,
Boualem Djezzar
,
Abdelmadjid Benabdelmoumene
,
Mohamed Goudjil
,
Bécharia Nadji
An Accurate Combination of on-the-fly Interface Trap and Threshold Voltage Methods for NBTI Degradation Extraction.
J. Electron. Test.
30 (4) (2014)
Hakim Tahi
,
Boualem Djezzar
,
Abdelmadjid Benabdelmoumene
,
Amel Chenouf
,
Mohamed Goudjil
Investigation of interface, shallow and deep oxide traps under NBTI stress using charge pumping technique.
Microelectron. Reliab.
54 (5) (2014)
Abdelmadjid Benabdelmoumene
,
Boualem Djezzar
,
Hakim Tahi
,
Amel Chenouf
,
Mohamed Goudjil
,
Rafik Serhane
,
Fayçal Hadj Larbi
,
Mohamed Kechouane
Does NBTI effect in MOS transistors depend on channel length?
ICM
(2014)
Amel Chenouf
,
Boualem Djezzar
,
Abdelmadjid Benabdelmoumene
,
Hakim Tahi
,
Mohamed Goudjil
Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses.
IDT
(2014)
Mohamed Boubaaya
,
Hakim Tahi
,
Boualem Djezzar
,
Karim Benmassai
,
Abdelmadjid Benabdelmoumene
,
Mohamed Goudjil
,
Djamila Doumaz
,
Abdelhak Feraht Hemida
, H and H2 as diffusion species.
IDT
(2014)
Hakim Tahi
,
Boualem Djezzar
,
Abdelmadjid Benabdelmoumene
A new procedure for eliminating the geometric component from charge pumping: Application for NBTI and radiation issues.
Microelectron. Reliab.
53 (4) (2013)