Test Generation for Acyclic Sequential Circuits with Hold Registers.

Tomoo Inoue Debesh Kumar Das Chiiho Sano Takahiro Mihara Hideo Fujiwara

Published in: ICCAD (2000)

Keyphrases

test generation
test cases
test sequences
design automation
symbolic execution
static analysis
software testing
quality assurance
high speed
mutation testing
np hard
np complete
database
database schemes
vision system
image data
high quality
computer vision
machine learning