Sign in
Test generation for bridging faults in CMOS ICs based on current monitoring versus signal propagation.
Uwe Gläser
Heinrich Theodor Vierhaus
M. Kley
A. Wiederhold
Published in:
ICCAD (1994)
Keyphrases
</>
test generation
test cases
mutation testing
abnormal events
test sequences
low cost
signal processing
power consumption
monitoring system
fault diagnosis
fault detection and diagnosis
low voltage
real time
high speed
artificial intelligence
quality assurance
database systems
symbolic execution