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A Unified Approach to Detecting Crosstalk Faults of Interconnects in Deep Sub-Micron VLSI.
Katherine Shu-Min Li
Chung-Len Lee
Chauchin Su
Jwu E. Chen
Published in:
Asian Test Symposium (2004)
Keyphrases
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power dissipation
cmos technology
input output
vlsi circuits
fault diagnosis
test cases
belief nets
database
electron beam
fault detection
power consumption
low cost
information systems
data mining
real world
databases
data sets