Binary Classifier for Fault Detection Based on KDE and PCA.
Tian CongJerzy BaranowskiPublished in: MMAR (2018)
Keyphrases
- fault detection
- principal component analysis
- fault diagnosis
- binary classifiers
- industrial processes
- feature space
- fault identification
- svm classifier
- condition monitoring
- tennessee eastman
- failure detection
- fault detection and diagnosis
- fault localization
- feature selection
- support vector machine
- power plant
- feature reduction
- principal components
- fault isolation
- support vector
- training set
- fuel cell
- fault detection and isolation
- feature extraction
- training data
- multi class
- covariance matrix
- search space
- dimensionality reduction
- face recognition
- neural network
- robust fault detection
- decision making
- pattern recognition
- high dimensional
- face images