On Improving Diagnostic Test Generation for Scan Chain Failures.
Xun TangRuifeng GuoWu-Tung ChengSudhakar M. ReddyYu HuangPublished in: Asian Test Symposium (2009)
Keyphrases
- test generation
- test cases
- test sequences
- symbolic execution
- static analysis
- design automation
- quality assurance
- test data generation
- code coverage
- data sets
- fault isolation
- regression testing
- software testing
- life cycle
- open source
- machine learning
- model based diagnosis
- expert systems
- image processing
- artificial intelligence