Inspection of polarizer tiny bump defects using computer vision.
Hsu-Nan YenMin-Jyun SyuPublished in: ICCE (2015)
Keyphrases
- computer vision
- automated visual inspection
- defect detection
- automatic inspection
- vision system
- machine vision
- quality control
- pattern recognition
- image sequences
- computer graphics
- printed circuit boards
- digital camera
- object recognition
- image understanding
- scene analysis
- computer vision systems
- object detection
- neural network
- feature extraction
- computer vision algorithms
- structure from motion
- image processing
- surface defects
- shape matching
- image interpretation
- virtual environment
- problems in computer vision
- image features
- face detection
- pose estimation