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LSTM-Based Intelligent Fault Detection for Fuzzy Markov Jump Systems and Its Application to Tunnel Diode Circuits.
Min Xue
Huaicheng Yan
Meng Wang
Hao Shen
Kaibo Shi
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2022)
Keyphrases
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fault detection
tunnel diode
intelligent systems
fault diagnosis
machine learning
markov chain
industrial processes
neural network
high speed
fault detection and diagnosis
control system
transmission line
condition monitoring
fault localization
failure detection
fault identification