SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits.

Kuen-Jong Lee Charles Njinda Melvin A. Breuer

Published in: DAC (1992)

Keyphrases

test generation
high speed
delay insensitive
asynchronous circuits
circuit design
analog vlsi
test cases
low power
design automation
logic circuits
test sequences
symbolic execution
vlsi circuits
power consumption
artificial intelligence
cmos technology
query processing
random access memory
databases