Login / Signup
An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability.
Tasuku Fujibe
Kazuki Shirahata
Takeshi Mizushima
Hidenobu Matsumura
Daisuke Watanabe
Hiroyuki Mineo
Shin Masuda
Published in:
ETS (2016)
Keyphrases
</>
high volume
printed circuit boards
test cases
physical characteristics
mobile devices
test generation
test data
statistical tests
fiber optic
software testing
test suite
high density
real time
high speed
response time
wireless sensor networks
data analysis
information retrieval