Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric.

Zheng Wang Duncan M. Hank Walker

Published in: VTS (2009)

Keyphrases

test generation
low cost
test cases
symbolic execution
test sequences
static analysis
low power
software testing
quality assurance
design automation
mutation testing
real time
regression testing
code coverage
complex systems
software development
test data generation
metadata
artificial intelligence
machine learning