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Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation.

Cecilia MetraMartin OmañaDaniele RossiJosé Manuel CazeauxT. M. Mak
Published in: IOLTS (2006)
Keyphrases
  • built in self test
  • fault diagnosis
  • high speed
  • shortest path
  • power dissipation
  • software engineering
  • fault detection
  • analog vlsi
  • infrared
  • power plant
  • analog circuits