Identifying Untestable Faults in Sequential Circuits.

Hsing-Chung Liang Chung-Len Lee Jwu E. Chen

Published in: IEEE Des. Test Comput. (1995)

Keyphrases

built in self test
high speed
fault diagnosis
model based diagnosis
test cases
fault models
real time
artificial neural networks
multiscale
case study
information systems
real world
fault detection
digital circuits
cmos technology
vlsi circuits
neural network
data sets