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A specimen-tracking controller for the transverse dynamic force microscope in non-contact mode.

Toshiaka HatanoKaiqiang ZhangSaid Ghani KhanThang NguyenGuido HerrmannChristopher EdwardsStuart C. BurgessMervyn G. Miles
Published in: ACC (2016)
Keyphrases
  • real time
  • dynamically updated
  • robotic manipulator
  • control system
  • dynamic environments
  • vision system
  • impedance control
  • neural network
  • optimal control
  • mobile robot
  • closed loop
  • visual inspection
  • control architecture