An ILP formulation to optimize test access mechanism in system-on-chip testing.
Mehrdad NouraniChristos A. PapachristouPublished in: ITC (2000)
Keyphrases
- test cases
- software testing
- test sequences
- inductive logic programming
- test generation
- test data
- test data generation
- statistical tests
- testing process
- hardware and software
- power consumption
- access control
- test driven development
- test suite
- number of test cases
- domain knowledge
- usability testing
- integration testing
- item response theory
- relational learning
- random access
- machine learning
- design methodology
- background knowledge
- case study