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Micro-XRD investigation of fine-pitch Cu-TSV induced thermo-mechanical stress in high-density 3D-LSI.

Mariappan MurugesanTakafumi FukushimaJi Chel BeaK. W. LeeMitsu KoyanagiY. ImaiS. KimuraTetsu Tanaka
Published in: 3DIC (2014)
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