Faults, Error Bounds and Reliability of Nanoelectronic Circuits.
Jie HanErin TaylorJianbo GaoJosé A. B. FortesPublished in: ASAP (2005)
Keyphrases
- error bounds
- built in self test
- theoretical analysis
- error detection
- worst case
- fault diagnosis
- fault detection
- fault models
- high speed
- reliability analysis
- model based diagnosis
- fault model
- circuit design
- root cause
- analog circuits
- finite sample
- logic circuits
- delay insensitive
- control system
- lateral inhibition
- logic synthesis
- abnormal events
- highly reliable
- low power