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On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST.

Emmanouil KalligerosXrysovalantis KavousianosDimitris BakalisDimitris Nikolos
Published in: J. Electron. Test. (2002)
Keyphrases
  • built in self test
  • high speed
  • information retrieval
  • artificial intelligence
  • image processing
  • multiresolution
  • probability distribution
  • test cases
  • test data
  • statistical tests
  • software testing
  • duty cycle