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On-the-Fly Reseeding: A New Reseeding Technique for Test-Per-Clock BIST.
Emmanouil Kalligeros
Xrysovalantis Kavousianos
Dimitris Bakalis
Dimitris Nikolos
Published in:
J. Electron. Test. (2002)
Keyphrases
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built in self test
high speed
information retrieval
artificial intelligence
image processing
multiresolution
probability distribution
test cases
test data
statistical tests
software testing
duty cycle