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Covering Test Holes of Functional Broadside Tests.
Irith Pomeranz
Published in:
ACM Trans. Design Autom. Electr. Syst. (2021)
Keyphrases
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post hoc
statistical tests
test suite
test generation
test data
multiple choice
similarity measure
databases
genetic algorithm
test cases
code coverage
data mining
training set
artificial neural networks
hidden markov models
diagnostic tests