A leakage current monitor circuit using silicon on thin BOX MOSFET for dynamic back gate bias control.
Hayate OkuharaKimiyoshi UsamiHideharu AmanoPublished in: COOL Chips (2015)
Keyphrases
- leakage current
- low voltage
- silicon dioxide
- cmos technology
- high speed
- power line
- field effect transistors
- design considerations
- electrical properties
- metal oxide semiconductor
- control system
- monitoring system
- real time
- gate insulator
- mathematical analysis
- low power
- control strategy
- power consumption
- semiconductor devices
- digital images