Specification-Driven Conformance Checking for Virtual/Silicon Devices Using Mutation Testing.
Haifeng GuJianning ZhangMingsong ChenTongquan WeiLi LeiFei XiePublished in: IEEE Trans. Computers (2021)
Keyphrases
- mutation testing
- test sequences
- test generation
- protocol specification
- virtual environment
- virtual world
- database applications
- semiconductor devices
- test suite
- low cost
- mobile devices
- augmented reality
- high level
- testing process
- data exchange
- test cases
- input device
- formal specification
- conceptual model
- three dimensional