On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction.
Danilo RavottoEdgar E. SánchezMassimiliano SchillaciMatteo Sonza ReordaGiovanni SquilleroPublished in: MTV (2007)
Keyphrases
- test cases
- test data
- test sequences
- statistical tests
- test generation
- software testing
- fully automatic
- automatic extraction
- data sets
- statistical significance
- finite state machines
- dynamic environments
- data driven
- knowledge extraction
- generation process
- generation method
- multiscale
- database
- testing process
- integration testing