Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits.
Mostafa I. H. Abd-El-BarrYanging XuCarl McCroskyPublished in: Great Lakes Symposium on VLSI (1999)
Keyphrases
- fault detection
- high speed
- circuit design
- floating gate
- power dissipation
- low power
- analog vlsi
- delay insensitive
- industrial processes
- fault diagnosis
- fault identification
- power consumption
- cmos technology
- focal plane
- vlsi circuits
- condition monitoring
- failure detection
- tennessee eastman
- chip design
- fault localization
- fuel cell
- robust fault detection
- fault detection and diagnosis
- mixed signal
- fault detection and isolation
- fuzzy logic
- evolutionary algorithm
- neural network
- low voltage
- random access memory
- power plant
- steady state
- artificial intelligence
- metal oxide semiconductor
- real time