Satisfiability-based test generation for nonseparable RTL controller-datapath circuits.
Loganathan LingappanSrivaths RaviNiraj K. JhaPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
- test generation
- test cases
- test sequences
- symbolic execution
- control system
- satisfiability problem
- wavelet transform
- quality assurance
- static analysis
- design automation
- phase transition
- software testing
- filter bank
- closed loop
- np complete
- computational complexity
- mutation testing
- circuit design
- test data generation
- control strategy
- data sets
- pattern matching
- test set
- database applications
- databases