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Hierarchical test generation for combinational circuits with real defects coverage.
T. Cibáková
Mária Fischerová
Elena Gramatová
Wieslaw Kuzmicz
Witold A. Pleskacz
Jaan Raik
Raimund Ubar
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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test generation
code coverage
test cases
test sequences
asynchronous circuits
logic circuits
symbolic execution
high speed
quality assurance
design automation
mutation testing
real world
data sets
software testing
static analysis