Experiences with parametric BIST for production testing PLLs with picosecond precision.
Rakesh KingerSwetha NarasimhawsamyStephen K. SunterPublished in: ITC (2010)
Keyphrases
- integrated circuit
- case study
- production system
- test cases
- high precision
- precision and recall
- manufacturing processes
- production scheduling
- test generation
- test data
- production process
- learning from experience
- real time
- software testing
- test suite
- parametric models
- quality control
- artificial neural networks
- decision making
- real world
- data sets