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TOF: a tool for test pattern generation optimization of an FPGA application oriented test.
Michel Renovell
Jean-Michel Portal
Penelope Faure
Joan Figueras
Yervant Zorian
Published in:
Asian Test Symposium (2000)
Keyphrases
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application oriented
optimization algorithm
software tools
optimization method
global optimization
optimization problems
high resolution
real time
optimization process
user friendly
systolic array
hardware design
statistical tests
stereo vision
test data
infrared
computer vision