Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits.
Hans-Joachim WunderlichSybille HellebrandPublished in: FTCS (1988)
Keyphrases
- test sequences
- pattern matching
- sequential patterns
- pattern detection
- real time
- floating gate
- case study
- test cases
- statistical significance
- automatically generating
- approximate pattern matching
- database
- analog vlsi
- analog circuits
- sequential data
- statistical tests
- associative memory
- test data
- genetic algorithm
- data mining