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On Testing of Superscalar Processors in Functional Mode for Delay Faults.

Nihar HageRohini GulveMasahiro FujitaVirendra Singh
Published in: VLSI Design (2017)
Keyphrases
  • test cases
  • fault model
  • fault diagnosis
  • fault detection
  • database
  • software engineering
  • real time
  • case study
  • model based diagnosis
  • data sets
  • artificial intelligence
  • multiscale
  • end to end
  • mutation testing